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Infrared & Hyperspectral

Short Wave Infrared (SWIR)

SVS-Vistek SWIR cameras incorporate Sony SenSWIR technology and the proven EXO and FXO camera platforms. Thanks to their wide spectral range and high sensitivity, SVS-Vistek SWIR cameras combine the benefits of an extremely compact footprint with a range from 400nm VIS to the SWIR range at 1700nm. With an innovative thermal design, users can have outstanding optical quality and dynamic range results, potentially using a single camera for multiple areas of the light spectrum.


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Laser Beam Analysis

Laser beam profiling is a technique used to analyze and characterize the properties of a laser beam complementary to simple power or energy measurements. It involves measuring various parameters such as spatial energy or intensity distribution, beam widths, centroid, ellipticity, and orientation. The primary goal of laser beam profiling is to obtain a comprehensive understanding of the laser beam's characteristics, which helps in assessing its performance and optimizing its usage for specific applications.